Advanced AI Software for Semiconductor Metrology

JUST CLICK... AND THAT’S IT

AI driven PCI-AM offers three levels of automation.
The first level allows you to simply click inside a device feature and it is automatically measured in accordance with a "recipe" that has been set up.
With the second level of automation, you can fully characterize a complete image with a single click.
The third and most powerful level of automation allows you to automatically characterize an entire folder of images.

Automated Image Measurement Software

PCI-AM offers measurements in both cross-section and top view images from SEMs (X-SEM) and TEMs in semiconductor laboratories, process development and engineering environments. Multiple edge detection techniques are employed depending on the nature and source of the image. This is vastly different from other tools designed for in-line metrology using top view images.

Very little set-up is required before you can be making fast, efficient automatic image measurements.

What's NEW in QUARTZ PCI-AM 8

Improved Edge Detection – better edge detection, particularly for TEM images
Image Auto Rotation – automatically orient features horizontally and vertically for ease of measurement
Measurement Tolerances – measurements can be checked against user-specified tolerances
Auto Layer Detection and Measurement – if needed these lines can be moved
Add Additional Reference Lines – assist in making desired measurements